> A LANEF delegation in Tsukuba (JAPAN)
A LANEF delegation in Tsukuba (JAPAN)
September 12-13 September 2013
In order to establish and deepen scientific collaborations between Grenoble and Tsukuba, a Memorandum of Understanding has been signed between LANEF and the ’Optical and Electronic Material Unit’ of the National Institute of Materials Sciences (NIMS).
Seven representatives of LANEF have visited several Tsukuba-based laboratories and meet their key leaders, over two days.
Their visit program included:
- the National Institute of Materials Sciences (NIMS),
- the TIA-nano (Tsukuba Innovation Arena ),
- the National Institute of Advanced Industrial Science and Technology (AIST) and
- the University of Tsukuba - with both representatives of the Embassy of France in Japan.
An official ceremony for the Memorandum of Understanding signing has taken place on September, 12:
From left to right :
Prof. Alain SCHUHL, Director of Institut Néel and board of LANEF
Prof. James ROUDET, Director of Grenoble Electrotechnic lab. and board of LANEF
Dr. Hideaki KITAZAWA, Unit Director of Quantum Beam Unit
Dr. Julien PERNOT, Institut Néel (wide bandgap semiconductors)
Prof. Etienne GHEERAERT, Institut Néel, Steering committee of LANEF (head of wide bandgap semiconductors research group, former attache for science and technology, French Embassy in Japan, and former NIRIM STA fellow)
Dr. Tokuyuki TERAJI, Senior Researcher of Optical and Electronic Materials Unit,
Dr. Herve BOUKARI, Institut Néel (spintronics)
Dr. Hiroyuki SUZUKI, Senior Researcher of Quantum Beam Unit